TEDf-VQWK-Testing

Back to Main Page >> DAQ Documentation Portal >> DAQ Testing

We will log bad boards and upload plots and descriptions of problems to: https://misportal.jlab.org/mis/apps/peer/submit.cfm

• Run 1654 - testing a board to replace CH "vqwk1" "bad" board
  • Plots
  • It works, this board can be used - has label on top "MDBKG"
  • This board is then used to replace the board in CH "vqwk1" and Tao has taken data to establish pedestals
  • HAPLOG 3619 describes BPM 8 test with new ADC in CH crate
  • run 1233 and 1234 were used to test (run 1233 had address conflict, so ignore)
• Run 1655 - A board that was laying around, board 26
  • Plots
  • It works
• Run 1656 - testing original CH "vqwk1" "bad" board (top 4 channels are bad, ch's 4-7).
  • Plots
  • Top 4 channels are bad, as seen in CH crate data
• Run 1657 - test ADC 15, the one with the strangely wired and tied on Op Amp
  • Plots
  • Works
• Run 1658 - test ADC 37 - ISU board that has recently had new channels go bad on it
  • Plots
  • Bad channels 2, 3, 4
  • Channels 2 and 4 are highly non-linear, basically flat lines offset from pedestal
  • Channel 3 works only in positive voltage range
  • No Japan error codes are reported